Stress Test: dd

### TEST NAME

> dd - disk I/O stress test

### SYNOPSIS

> `sh runtests` disk_slice

### DESCRIPTION

> `dd` performs read and write tests on disk_slice. The read test reads from disk_slice repeatedly, using different block sizes on both raw and block devices. The test then writes to `/dev/null`.

> The write test writes to disk_slice from `/dev/zero` repeatedly, using different block sizes on both raw and block devices.

> CAUTION: Specify an unused slice for disk_slice. All data on disk_slice will be lost.

### OUTPUT

> Test results are output to the screen.

### DURATION

> 24 hours

### POSSIBLE CONCURRENT TESTS

> This test can run concurrently with `CON5`, `cdrom`, and `fs_stress`.

### EXAMPLES

> > `# sh runtests c2t1d0s7`

### REFERENCES

> `dd`(1M)

Copyright 2005 Sun Microsystems, Inc. All rights reserved.